The increase in brightness of synchrotron sources, the improvment of the efficiency and dynamic sensors have led to an increase of 6 orders of magnitude at least to the speed of X-ray diffraction measurements. The current throughput enable new modalities of X-ray diffraction caracterisation, provided that one masters the reduction and analysis of large amounts of the data thus generated.
The purpose of the workshop is to explore both new uses of X-rays diffraction enabled by these instrumental developments and the developments of the tools essential for the exploitation of the data produced.
Practical information
The workshop will take place from November 7th to 10th, on the site of the Synchrotron SOLEIL, and will include two days of seminars and two days of setting practices on DiiffAbs beamline (experimental realization) and IPANEMA (data mining). The detailed program is short of completion and will be avaialble here.
